Title :
The application of experimental design to the analysis of semiconductor manufacturing lines
Author :
Hood, Sarah J. ; Welch, Peter D.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
Flexible, interactive software is used to apply a two-level fractional factorial design with ten factors to the discrete event simulation of a semiconductor manufacturing line. The authors analyse the sensitivity of the cycle time to the number of tools and the operator-to-tool ratio at five tool groups that tend to have large queues preceding them. The analysis confirms the proposed model for the cycle time and illustrates the efficiency of using experimental design for discrete event simulation. A review of ancillary output data from each run corroborates the results of the experimental analysis, namely that tool effects predominate. The main effects for the tools are ordered according to utilization
Keywords :
CAD; discrete event simulation; integrated circuit manufacture; interactive systems; manufacturing data processing; ancillary output data; cycle time; discrete event simulation; experimental design; interactive software; operator-to-tool ratio; queues; semiconductor manufacturing lines; tool utilization; two-level fractional factorial design; Application software; Design for experiments; Discrete event simulation; Feeds; Flexible manufacturing systems; Queueing analysis; Semiconductor device manufacture; Semiconductor device modeling; Stationary state; Virtual manufacturing;
Conference_Titel :
Simulation Conference, 1990. Proceedings., Winter
Conference_Location :
New Orleans, LA
Print_ISBN :
0-911801-72-3
DOI :
10.1109/WSC.1990.129531