• DocumentCode
    2939621
  • Title

    The application of experimental design to the analysis of semiconductor manufacturing lines

  • Author

    Hood, Sarah J. ; Welch, Peter D.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    1990
  • fDate
    9-12 Dec 1990
  • Firstpage
    303
  • Lastpage
    309
  • Abstract
    Flexible, interactive software is used to apply a two-level fractional factorial design with ten factors to the discrete event simulation of a semiconductor manufacturing line. The authors analyse the sensitivity of the cycle time to the number of tools and the operator-to-tool ratio at five tool groups that tend to have large queues preceding them. The analysis confirms the proposed model for the cycle time and illustrates the efficiency of using experimental design for discrete event simulation. A review of ancillary output data from each run corroborates the results of the experimental analysis, namely that tool effects predominate. The main effects for the tools are ordered according to utilization
  • Keywords
    CAD; discrete event simulation; integrated circuit manufacture; interactive systems; manufacturing data processing; ancillary output data; cycle time; discrete event simulation; experimental design; interactive software; operator-to-tool ratio; queues; semiconductor manufacturing lines; tool utilization; two-level fractional factorial design; Application software; Design for experiments; Discrete event simulation; Feeds; Flexible manufacturing systems; Queueing analysis; Semiconductor device manufacture; Semiconductor device modeling; Stationary state; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 1990. Proceedings., Winter
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    0-911801-72-3
  • Type

    conf

  • DOI
    10.1109/WSC.1990.129531
  • Filename
    129531