Title :
A New Angle-Based Spectral Index and Its Application in Drought Monitoring
Author :
Liu Hailei ; Xu Lisheng ; Ding Jilie ; Deng Xiaobo
Author_Institution :
Atmos. Radiat. & Satellite Remote Sensing Lab., Chengdu Univ. of Inf. Technol., Chengdu, China
Abstract :
An angle-based drought spectral index (ABDI) was proposed aimed to drought monitoring based on Near Infrared (NIR, 858 nm) and Shortwave Infrared (SWIR, 1240 and 1640 nm) bands of the Moderate Resolution Imaging Spectrometer (MODIS). The Shortwave Angle Slope Index (SASI) is reviewed and analyzed. United States Geological Survey (USGS) spectral datasets were employed to validate the ability of ABDI to estimate soil and vegetation moisture. Six-year(2002-2007) time series of Normalized Difference Vegetation Index (NDVI), Normalized Difference Water Index (NDWI) and ABDI was created and analyzed for drought assessment and monitoring within the region of Nanchong in Sichuan Province, using MODIS history data and meteorological data. The investigation of a six-year history of MODIS NDVI, NDWI and ABDI indicates that a strong relationship exists among NDWI, ABDI and 2006 drought conditions of eastern Sichuan Basin. And the proposed ABDI had a stronger response to regional drought than NDVI and NDWI, which can be a practical method of drought monitoring in both accuracy and efficiency.
Keywords :
hydrological techniques; hydrology; radiometry; soil; vegetation; AD 2002 to 2007; Moderate Resolution Imaging Spectrometer; Nanchong; Normalized Difference Vegetation Index; Normalized Difference Water Index; Sichuan Province; United States Geological Survey spectral datasets; angle-based drought spectral index; drought monitoring; near infrared bands; shortwave angle slope index; shortwave infrared bands; soil moisture; time series; vegetation moisture; wavelength 1240 nm; wavelength 1640 nm; wavelength 858 nm; History; Image resolution; Infrared imaging; Infrared spectra; Infrared surveillance; MODIS; Monitoring; Optical imaging; Spectroscopy; Vegetation mapping;
Conference_Titel :
Photonics and Optoelectronic (SOPO), 2010 Symposium on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4963-7
Electronic_ISBN :
978-1-4244-4964-4
DOI :
10.1109/SOPO.2010.5504322