Title :
Analysis of disorder-induced dephasing
Author :
Weiser, S. ; Meier, T. ; Mobius, J. ; Euteneuer, A. ; Mayer, E.J. ; Stolz, W. ; Hofmann, Martin ; Ruhle, W.W. ; Thomas, Paul ; Koch, S.W.
Author_Institution :
Dept. of Phys. & Mater. Sci., Philipps-Univ., Marburg, Germany
Abstract :
Summary form only given. A number of experiments yielded a polarization-dependent decay of the time-integrated four-wave-mixing (TI-FWM). Often, the TI-FWM decays more rapidly for linear perpendicular than for linear parallel polarized incident pulses. It was suspected that this difference in the decay times is related to the inhomogeneous linewidth of the exciton, i.e. to disorder. On the other hand, it was demonstrated that the understanding of polarization-dependent FWM and pump-probe experiments following excitonic excitation requires the treatment of Coulomb correlations beyond the Hartree-Fock level. For not too strong disorder, these correlations still remain important and influence the nonlinear optical response. A meaningful analysis of disorder effects thus has to include correlations. We analyze the origin of the polarization-dependent disorder-induced dephasing in TI-FWM by performing microscopic model calculations which include both energetic disorder and Coulomb correlations. Correlations are treated exactly up to third-order in the field and energetic disorder is taken from random distribution functions over which the optical response is averaged.
Keywords :
electron correlations; excitons; light polarisation; multiwave mixing; time resolved spectra; Coulomb correlations; averaged optical response; destructive interference; disorder-induced dephasing; energetic disorder; inhomogeneous exciton linewidth; microscopic model calculations; polarization-dependent decay; random distribution functions; time-integrated four-wave-mixing; Art; Equations; Excitons; Optical propagation; Optical pumping; Optical scattering; Particle scattering; Resonance;
Conference_Titel :
Quantum Electronics Conference, 2000. Conference Digest. 2000 International
Conference_Location :
Nice, France
Print_ISBN :
0-7803-6318-3
DOI :
10.1109/IQEC.2000.908038