Title :
Observation of disorder induced crossover in the underlying mechanism for the anomalous Hall Effect and intrinsic spin currents in Ga1-xMnxAs
Author :
Chun, S.H. ; Kim, Y.S. ; Choi, H.K. ; Jeong, I.T. ; Lee, W.O. ; Suh, K.S. ; Oh, Y.S. ; Kim, K.H. ; Khim, Z.G. ; Woo, J.C. ; Park, Y.D.
Author_Institution :
Sejong Univ., Seoul
Abstract :
Here, we report on the transport and Hall measurements on a series of Ga1-xMnxAs where we explicitly control the total Mn concentration (NMn) during low temperature molecular beam epitaxy (LT-MBE) growth and implicitly control group III substitutional Mn concentration (NMn) by low temperature annealing. After growth, monitored by in situ RHEED, and NMrl determined by HRXRD and EPMA, a series of Ga1-xMnxAs epilayers were patterned into Hall bars utilizing standard photolithographic techniques as well as citric acid/hydrogen peroxide-based standard GaAs etchant and annealed in a flowing N2 environment in a tube furnace for an hour with annealing temperature varied from 200-350 degC as monitored near the sample.
Keywords :
III-V semiconductors; annealing; gallium arsenide; magnetic epitaxial layers; manganese compounds; molecular beam epitaxial growth; reflection high energy electron diffraction; semiconductor epitaxial layers; semimagnetic semiconductors; spin Hall effect; GaMnAs; Hall measurements; anomalous Hall effect; disorder induced crossover; epilayers; in situ RHEED; intrinsic spin currents; low temperature annealing; low temperature molecular beam epitaxy; manganese concentration; photolithographic techniques; tube furnace; underlying mechanism; Annealing; Bars; Etching; Furnaces; Gallium arsenide; Hall effect; Hydrogen; Molecular beam epitaxial growth; Monitoring; Temperature control;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.376095