DocumentCode :
2939878
Title :
A 1.39-V input fast-transient-response digital LDO composed of low-voltage MOS transistors in 40-nm CMOS process
Author :
Onouchi, Masafumi ; Otsuga, Kazuo ; Igarashi, Yasuto ; Ikeya, Toyohito ; Morita, Sadayuki ; Ishibashi, Koichiro ; Yanagisawa, Kazumasa
Author_Institution :
Renesas Electron. Corp., Tokyo, Japan
fYear :
2011
fDate :
14-16 Nov. 2011
Firstpage :
37
Lastpage :
40
Abstract :
A fast transient-response digital low-dropout (LDO) voltage regulator comprising only low-voltage MOS transistors was developed. The input voltage can be higher than the withstand voltage of the low-voltage MOS transistors by the proposed withstand-voltage relaxation scheme. The switching frequency of 1 GHz can be achieved using small-dimension low-voltage power-MOS transistors. The LDO occupies only 0.057 mm2 area using 40-nm CMOS technology, and covers a wide range of load currents from 400 μA to 250 mA. The response time is only 0.07 μs.
Keywords :
low-power electronics; power MOSFET; transient response; voltage regulators; CMOS process; current 400 muA to 250 mA; fast transient-response digital LDO voltage regulator; fast transient-response digital low-dropout voltage regulator; frequency 1 GHz; size 40 nm; small-dimension low- voltage power-MOS transistor; switching frequency; time 0.07 mus; voltage 1.39 V; withstand-voltage relaxation scheme; Electrical resistance measurement; MOSFETs; Regulators; Resistance; Time factors; Voltage control; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference (A-SSCC), 2011 IEEE Asian
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-1784-0
Type :
conf
DOI :
10.1109/ASSCC.2011.6123569
Filename :
6123569
Link To Document :
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