• DocumentCode
    2939878
  • Title

    A 1.39-V input fast-transient-response digital LDO composed of low-voltage MOS transistors in 40-nm CMOS process

  • Author

    Onouchi, Masafumi ; Otsuga, Kazuo ; Igarashi, Yasuto ; Ikeya, Toyohito ; Morita, Sadayuki ; Ishibashi, Koichiro ; Yanagisawa, Kazumasa

  • Author_Institution
    Renesas Electron. Corp., Tokyo, Japan
  • fYear
    2011
  • fDate
    14-16 Nov. 2011
  • Firstpage
    37
  • Lastpage
    40
  • Abstract
    A fast transient-response digital low-dropout (LDO) voltage regulator comprising only low-voltage MOS transistors was developed. The input voltage can be higher than the withstand voltage of the low-voltage MOS transistors by the proposed withstand-voltage relaxation scheme. The switching frequency of 1 GHz can be achieved using small-dimension low-voltage power-MOS transistors. The LDO occupies only 0.057 mm2 area using 40-nm CMOS technology, and covers a wide range of load currents from 400 μA to 250 mA. The response time is only 0.07 μs.
  • Keywords
    low-power electronics; power MOSFET; transient response; voltage regulators; CMOS process; current 400 muA to 250 mA; fast transient-response digital LDO voltage regulator; fast transient-response digital low-dropout voltage regulator; frequency 1 GHz; size 40 nm; small-dimension low- voltage power-MOS transistor; switching frequency; time 0.07 mus; voltage 1.39 V; withstand-voltage relaxation scheme; Electrical resistance measurement; MOSFETs; Regulators; Resistance; Time factors; Voltage control; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference (A-SSCC), 2011 IEEE Asian
  • Conference_Location
    Jeju
  • Print_ISBN
    978-1-4577-1784-0
  • Type

    conf

  • DOI
    10.1109/ASSCC.2011.6123569
  • Filename
    6123569