• DocumentCode
    2940095
  • Title

    A high-gain wide-input-range time amplifier with an open-loop architecture and a gain equal to current bias ratio

  • Author

    Kwon, Hye-Jung ; Lee, Jae-seung ; Sim, Jae-Yoon ; Park, Hong-June

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol. (POSTECH), Pohang, South Korea
  • fYear
    2011
  • fDate
    14-16 Nov. 2011
  • Firstpage
    325
  • Lastpage
    328
  • Abstract
    Recently, time amplifiers are used in time-to-digital converters (TDC) because the time resolution is better than the voltage resolution in modern integrated circuits. However, the conventional time amplifiers are limited in their time gain and input time difference range, because of their positive-feedback closed-loop architecture. An open-loop time amplifier is proposed in this work to achieve a large time gain up to 120 and a wide range of input time difference(10ps~2ns). Besides, the time gain is the same as the current bias ratio. The worst-case average gain error which shows linear characteristics of the time amplifier is smaller than 5.3% The proposed time amplifier was successfully used in the monitoring circuit for threshold voltage variations of NMOS and PMOS FETs. The monitoring circuit consists of VCDL, time amplifier and TDC. The circuit was implemented by 0.13μm CMOS process.
  • Keywords
    CMOS analogue integrated circuits; feedback amplifiers; time-digital conversion; CMOS process; NMOSFET; PMOSFET; current bias ratio; high-gain wide-input-range time amplifier; integrated circuits; monitoring circuit; open-loop architecture; open-loop time amplifier; positive-feedback closed-loop architecture; size 0.13 mum; threshold voltage variations; time 10 ps to 2 ns; time-to-digital converters; worst-case average gain error; Clocks; MOSFET circuits; Monitoring; Threshold voltage; Tin; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference (A-SSCC), 2011 IEEE Asian
  • Conference_Location
    Jeju
  • Print_ISBN
    978-1-4577-1784-0
  • Type

    conf

  • DOI
    10.1109/ASSCC.2011.6123579
  • Filename
    6123579