• DocumentCode
    2940145
  • Title

    On-the-fly dynamic voltage scaling (DVS) in 65nm energy-efficient power management with frequency-based control (FBC) for SoC system

  • Author

    Lee, Yu-Huei ; Chiu, Chao-Chang ; Chen, Ke-Horng ; Lin, Ying-Hsi ; Huang, Chen-Chih

  • Author_Institution
    Inst. of Electr. Control Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2011
  • fDate
    14-16 Nov. 2011
  • Firstpage
    329
  • Lastpage
    332
  • Abstract
    A 65nm energy-efficient power management (PM) with frequency-based control (FBC) is proposed for achieving dynamic voltage scaling (DVS) on-the-fly in SoC system. Both DVS and dynamic frequency scaling (DFS) operation are the main specifications for system processors. The controlled loop of the proposed single-inductor dual-output (SIDO) power module is merged with the frequency-controlled phase-lock-loop (PLL) aims to simultaneously achieve both DVS and DFS operations, and thereby is not affected by process, supply voltage, and temperature (PVT) variation. In spite of using complex power processor control scheme, the proposed DVS on-the-fly power module can directly receive the demand from system processor. Experimental results show that the SIDO power module can realize a peak efficiency of 90%, and the system processor power can be reduced by 33% with the on-the-fly operation under the different temperature conditions.
  • Keywords
    digital phase locked loops; system-on-chip; PLL; SoC system; complex power processor control scheme; controlled loop; dynamic frequency scaling operation; efficiency 90 percent; energy-efficient power management; frequency-controlled phase-lock-loop; on-the-fly dynamic voltage scaling; single-inductor dual-output power module; size 65 nm; supply voltage; system-on-chip system; temperature variation; Inductors; Monitoring; Multichip modules; Phase locked loops; Program processors; System-on-a-chip; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference (A-SSCC), 2011 IEEE Asian
  • Conference_Location
    Jeju
  • Print_ISBN
    978-1-4577-1784-0
  • Type

    conf

  • DOI
    10.1109/ASSCC.2011.6123580
  • Filename
    6123580