Title :
Facts allocation for power systems voltage stability enhancement using MOPSO
Author :
Laïfa, Abdelaziz ; Boudour, Mohamed
Author_Institution :
Dept. de genie Electr., Univ. du 20 Aout, Skikda
Abstract :
Location of the static VAR compensator (SVC) and other types of FACTS devices is important for the enhancement of practical power systems voltage stability. In this paper, a Multi-objective particle swarm optimization (MOPSO) is used to solve a mixed continuous-discrete multi-objective optimization problem in order to find optimal location of FACTS. Various objectives are considered, namely voltage stability improvement, real power loss minimization and load voltage deviations minimization. Simulations are performed on IEEE 14 test system for optimal location and size of FACTS devices. Analysis of the initial conditions to determine the voltage stability margins and a contingency analysis to determine the critical outages with respect to the voltage stability margin are also examined in order to evaluate their effect on the location analysis. The obtained results show that with the allocation of FACTS devices with the proposed method, the voltage stability is considerably enhanced in both normal state and critical contingencies. The calculation of the load margin demonstrates the effectiveness of the proposed method.
Keywords :
flexible AC transmission systems; particle swarm optimisation; power system stability; static VAr compensators; FACTS allocation; IEEE 14 test system; contingency analysis; load voltage deviation minimization; mixed continuous-discrete multiobjective optimization problem; multiobjective particle swarm optimization; power loss minimization; power systems voltage stability enhancement; static VAR compensator; voltage stability margin; Power capacitors; Power system analysis computing; Power system faults; Power system planning; Power system simulation; Power system stability; Stability analysis; Static VAr compensators; Thyristors; Voltage; FACTS location; MOPSO; SVC; Static Voltage Stability; TCSC; Voltage Collapse;
Conference_Titel :
Systems, Signals and Devices, 2008. IEEE SSD 2008. 5th International Multi-Conference on
Conference_Location :
Amman
Print_ISBN :
978-1-4244-2205-0
Electronic_ISBN :
978-1-4244-2206-7
DOI :
10.1109/SSD.2008.4632855