DocumentCode :
2940788
Title :
Longitudinal and lateral finite size effects in NA-FMR measurements
Author :
Counil, G. ; Kim, J. ; Devolder, T. ; Crozat, P. ; Chappert, C. ; Zoll, S. ; Fournel, R.
Author_Institution :
Inst. d´´Electron. Fondamentale, Orsay
fYear :
2006
fDate :
8-12 May 2006
Firstpage :
429
Lastpage :
429
Abstract :
In the linear regime, a measure of the magnetic damping can be obtained from the linewidth of the ferromagnetic resonance peak. One means of distinguishing between different classes of damping mechanisms is to examine the frequency dependence of the linewidth. With network analyzer ferromagnetic resonance (NA-FMR), the magnetic susceptibility can be measured in the 0-26 GHz range, from which one can obtain valuable information about how energy dissipation evolves at higher frequencies. The NA-FMR does, however, present a number of caveats. Under certain resonance conditions, for example, it is possible that non-uniform spin-wave modes are excited, due to a driving magnetic field that will be necessarily non-uniform when viewed by a sample whose dimensions exceed those of the central conductor of the coplanar wave guide. This results in the excitation of spin waves, which cause broadening of the resonance peak and then an apparent enhancement of the measured linewidth. We analyze quantitatively the contribution of this experimental source of error and show how to extract the value of the "intrinsic" damping.
Keywords :
ferromagnetic resonance; magnetic susceptibility; network analysers; size effect; NA-FMR measurements; energy dissipation; inductive methods; lateral finite size effects; longitudinal finite size effects; magnetic susceptibility; network analyzer ferromagnetic resonance; Damping; Energy measurement; Frequency dependence; Frequency measurement; Information analysis; Magnetic analysis; Magnetic field measurement; Magnetic resonance; Magnetic susceptibility; Size measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
Type :
conf
DOI :
10.1109/INTMAG.2006.376153
Filename :
4261862
Link To Document :
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