DocumentCode :
2940930
Title :
A 1.8V 11μW CMOS smart humidity sensor for RFID sensing applications
Author :
Tan, Zhichao ; Daamen, Roel ; Humbert, Aurélie ; Souri, Kamran ; Chae, Youngcheol ; Ponomarev, Youri V. ; Pertijs, Michiel A P
Author_Institution :
Electron. Instrum. Lab., Delft Univ. of Technol., Delft, Netherlands
fYear :
2011
fDate :
14-16 Nov. 2011
Firstpage :
105
Lastpage :
108
Abstract :
A fully-integrated humidity sensor for a smart RFID sensor platform has been realized in 0.16μm standard CMOS technology. It consists of a top-metal finger-structure capacitor covered with a humidity-sensitive layer, combined with a micro-power flexible sensor interface based on a second-order incremental delta-sigma converter. The interface can be easily reconfigured to compensate for process variation of the sensing element. In a measurement time of 10.2 ms, the interface performs a 13-bits capacitance-to-digital conversion while consuming only 5.85 μA from 1.8 V supply. In combination with the co-integrated sensor capacitor, it thus provides a humidity-to-digital conversion with a resolution of 0.1% RH in the range of 20% to 90% RH at only 107 nJ per measurement. This represents a significant improvement in energy efficiency compared to existing capacitive-sensor interfaces with comparable performance.
Keywords :
capacitive sensors; compensation; delta-sigma modulation; energy conservation; humidity sensors; intelligent sensors; radiofrequency identification; CMOS smart humidity sensor; capacitance-to-digital conversion; capacitive-sensor interfaces; co-integrated sensor capacitor; energy efficiency; fully-integrated humidity sensor; humidity-sensitive layer; humidity-to-digital conversion; micropower flexible sensor interface; power 11 muW; process variation compensation; second-order incremental delta-sigma converter; sensing element; size 0.16 mum; smart RFID sensor platform; top-metal finger-structure capacitor; voltage 1.8 V; word length 13 bit; Capacitance; Capacitors; Energy efficiency; Humidity; Humidity measurement; Modulation; Semiconductor device measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference (A-SSCC), 2011 IEEE Asian
Conference_Location :
Jeju
Print_ISBN :
978-1-4577-1784-0
Type :
conf
DOI :
10.1109/ASSCC.2011.6123615
Filename :
6123615
Link To Document :
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