Title :
ETE: a customizable approach to measuring end-to-end response times and their components in distributed systems
Author :
Hellerstein, Joseph L. ; Maccabee, Mark M. ; Mills, W. Nathaniel, III ; Turek, John J.
Author_Institution :
IBM Corp., Hawthorne, NY, USA
Abstract :
Detecting and resolving performance problems in distributed systems often requires measurements of end-to-end (“finger tip to eyeball”) response times. Existing approaches embed transaction definitions in instrumentation codes. As a result, service providers (e.g., ISPs) cannot tailor transaction definitions to the usage patterns of their customers. We propose a new approach-ETE (end-to-end)-in which transaction definitions are externalized so that they can be customized. This is accomplished by having instrumentation generate events (not transactions) and employing a separate component-the transaction generator-that uses external definitions of transactions to construct response time measurements from event streams. ETE provides measurements of both end-to-end response times and their components. The latter reflect delays for services within distributed systems (e.g., name resolution service). We have used ETE to measure response times for Web transactions, terminal emulators, and Lotus Notes
Keywords :
distributed processing; performance evaluation; time measurement; transaction processing; ETE; ISPs; Lotus Notes; Web transactions; customizable approach; distributed systems; end-to-end response time measurement; event streams; external definitions; instrumentation codes; name resolution service; performance problems; response time measurements; service providers; terminal emulators; transaction definitions; transaction generator; usage patterns; Degradation; Delay; Distributed computing; Explosives; Instruments; Milling machines; Time factors; Time measurement; Web and internet services; Web pages;
Conference_Titel :
Distributed Computing Systems, 1999. Proceedings. 19th IEEE International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7695-0222-9
DOI :
10.1109/ICDCS.1999.776516