Title :
A Novel Test Bench for UFPA
Author :
Liu Ziji ; Jiang Yadong ; Zhu Hongbin ; Min, Que
Author_Institution :
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
Abstract-Some parameter testing standards of Infrared Focal Plane Array performances were analyzed in this paper, the performance parameters testing systems of uncooled infrared focal plane device are developed, testing systems are established, including the radiation sources, the UFPA modules, signal acquisition module and the host computer program, the system can real-time transfer data through PCIE bus, stores, statistics and analysis the parameters, such as noise, responsivity, detectivity, noise equivalent power (NEP) and noise equivalent temperature difference (NETD). It can accurately determine the number of blind pixels and located them, quantitatively statistics non-uniformity, and to assess the performance of focal plane devices.
Keywords :
Infrared detectors; Optical computing; Performance analysis; Performance evaluation; Radiation detectors; Real time systems; Signal analysis; Standards development; Statistical analysis; System testing;
Conference_Titel :
Photonics and Optoelectronic (SOPO), 2010 Symposium on
Conference_Location :
Chengdu, China
Print_ISBN :
978-1-4244-4963-7
Electronic_ISBN :
978-1-4244-4964-4
DOI :
10.1109/SOPO.2010.5504400