DocumentCode
2941144
Title
A Novel Test Bench for UFPA
Author
Liu Ziji ; Jiang Yadong ; Zhu Hongbin ; Min, Que
Author_Institution
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear
2010
fDate
19-21 June 2010
Firstpage
1
Lastpage
3
Abstract
Abstract-Some parameter testing standards of Infrared Focal Plane Array performances were analyzed in this paper, the performance parameters testing systems of uncooled infrared focal plane device are developed, testing systems are established, including the radiation sources, the UFPA modules, signal acquisition module and the host computer program, the system can real-time transfer data through PCIE bus, stores, statistics and analysis the parameters, such as noise, responsivity, detectivity, noise equivalent power (NEP) and noise equivalent temperature difference (NETD). It can accurately determine the number of blind pixels and located them, quantitatively statistics non-uniformity, and to assess the performance of focal plane devices.
Keywords
Infrared detectors; Optical computing; Performance analysis; Performance evaluation; Radiation detectors; Real time systems; Signal analysis; Standards development; Statistical analysis; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Photonics and Optoelectronic (SOPO), 2010 Symposium on
Conference_Location
Chengdu, China
Print_ISBN
978-1-4244-4963-7
Electronic_ISBN
978-1-4244-4964-4
Type
conf
DOI
10.1109/SOPO.2010.5504400
Filename
5504400
Link To Document