• DocumentCode
    2941144
  • Title

    A Novel Test Bench for UFPA

  • Author

    Liu Ziji ; Jiang Yadong ; Zhu Hongbin ; Min, Que

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • fYear
    2010
  • fDate
    19-21 June 2010
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Abstract-Some parameter testing standards of Infrared Focal Plane Array performances were analyzed in this paper, the performance parameters testing systems of uncooled infrared focal plane device are developed, testing systems are established, including the radiation sources, the UFPA modules, signal acquisition module and the host computer program, the system can real-time transfer data through PCIE bus, stores, statistics and analysis the parameters, such as noise, responsivity, detectivity, noise equivalent power (NEP) and noise equivalent temperature difference (NETD). It can accurately determine the number of blind pixels and located them, quantitatively statistics non-uniformity, and to assess the performance of focal plane devices.
  • Keywords
    Infrared detectors; Optical computing; Performance analysis; Performance evaluation; Radiation detectors; Real time systems; Signal analysis; Standards development; Statistical analysis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronic (SOPO), 2010 Symposium on
  • Conference_Location
    Chengdu, China
  • Print_ISBN
    978-1-4244-4963-7
  • Electronic_ISBN
    978-1-4244-4964-4
  • Type

    conf

  • DOI
    10.1109/SOPO.2010.5504400
  • Filename
    5504400