DocumentCode :
2941288
Title :
Cross-sampled GRAPPA for parallel MRI
Author :
Wang, Haifeng ; Liang, Dong ; King, Kevin F. ; Nagarsekar, Gajanan ; Ying, Leslie
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Wisconsin, Milwaukee, WI, USA
fYear :
2010
fDate :
Aug. 31 2010-Sept. 4 2010
Firstpage :
3325
Lastpage :
3328
Abstract :
As one widely-used parallel-imaging method, Generalized Auto-calibrating Partially Parallel Acquisitions (GRAPPA) technique reconstructs the missing k-space data by a linear combination of the acquired data using a set of weights. These weights are usually derived from auto-calibration signal (ACS) lines that are acquired in parallel to the reduced lines. In this paper, a cross sampling method is proposed to acquire the ACS lines orthogonal to the reduced lines. This cross sampling method increases the amount of calibration data along the direction that the k-space is undersampled and thus improves the calibration accuracy, especially when a small number of ACS lines are acquired. Both phantom and in vivo experiments demonstrate that the proposed method, named cross-sampled GRAPPA (CS-GRAPPA), can effectively reduce the aliasing artifacts of GRAPPA when high acceleration is desired.
Keywords :
biomedical MRI; calibration; image reconstruction; medical image processing; CS-GRAPPA; GRAPPA technique; Generalized Autocalibrating Partially Parallel Acquisitions; acquired data linear combination; autocalibration signal; calibration accuracy; cross sampled GRAPPA; missing k-space data reconstruction; parallel MRI; parallel imaging method; Calibration; Coils; Fourier transforms; Image reconstruction; Magnetic resonance imaging; Phantoms; Algorithms; Artifacts; Brain; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Magnetic Resonance Imaging; Reproducibility of Results; Sample Size; Sensitivity and Specificity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4123-5
Type :
conf
DOI :
10.1109/IEMBS.2010.5627278
Filename :
5627278
Link To Document :
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