DocumentCode :
2941377
Title :
Automatic detection of EEG artefacts arising from head movements
Author :
O´Regan, S. ; Faul, Stephen ; Marnane, William
Author_Institution :
Dept. of Electr. Eng., Univ. Coll. Cork, Cork, Ireland
fYear :
2010
fDate :
Aug. 31 2010-Sept. 4 2010
Firstpage :
6353
Lastpage :
6356
Abstract :
The need for reliable detection of artefacts in raw and processed EEG is widely acknowledged. In this paper, we present the results of an investigation into appropriate features for artefact detection in the REACT ambulatory EEG system. The study focuses on EEG artefacts arising from head movement. The use of one generalised movement artefact class to detect movement artefacts is proposed. Temporal, frequency, and entropy-based features are evaluated using Kolmogorov-Smirnov and Wilcoxon rank-sum non-parametric tests, Mutual Information Evaluation Function and Linear Discriminant Analysis. Results indicate good separation between normal EEG and artefacts arising from head movement, providing a strong argument for treating these head movement artefacts as one generalised class rather than treating their component signals individually.
Keywords :
biomechanics; electroencephalography; medical signal detection; medical signal processing; EEG artefact automatic detection; Kolmogorov-Smirnov rank-sum nonparametric test; REACT ambulatory EEG system; Wilcoxon rank-sum nonparametric test; entropy-based features; head movements; linear discriminant analysis; mutual information evaluation function; Electroencephalography; Entropy; Feature extraction; Magnetic heads; Muscles; Mutual information; Sensitivity; Brain-Computer Interface; EEG; Electroencephalography; Feature extraction; Linear Discriminant Analysis; Mutual Information Evaluation Function; artefact detection; movement artefacts; seizure; Artifacts; Electroencephalography; Humans; Signal Processing, Computer-Assisted;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4123-5
Type :
conf
DOI :
10.1109/IEMBS.2010.5627282
Filename :
5627282
Link To Document :
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