Nanometer scale correlation of magnetic and structural features in Ni2MnGa

Author

Sasso, C.P. ; Pasquale, M. ; Celegato, F. ; Olivetti, E. ; Chernenko, V.A.

Author_Institution

IEN Galileo Ferraris, Torino

fYear

2006

fDate

8-12 May 2006

Firstpage

460

Lastpage

460

Abstract

In this work we present experimental results and a discussion of the structural and magnetic features leading to a minimum magnetic correlation length of the order of 20 nm thick films of Ni₂MnGa deposited on MgO substrates. The study is conducted using a vibrating sample magnetometer (VSM) for the magnetic characterization and an atomic force-magnetic force microscope (AFM-MFM) setup, which allows for simultaneous imaging of the structural and magnetic characteristics of the sample surface. The magnetization curves show a coercivity of the order of 4-10 kA/m and an anisotropy field of the order of 160-300 kA/m.

Keywords

coercive force; gallium alloys; magnetic anisotropy; magnetometers; manganese alloys; metallic thin films; nickel alloys; MgO; Ni₂MnGa; anisotropy field; atomic force-magnetic force microscope; coercivity; magnetic characterization; magnetic correlation length; magnetization curves; nanometer scale correlation; thick films; vibrating sample magnetometer; Anisotropic magnetoresistance; Atomic force microscopy; Atomic layer deposition; Coercive force; Magnetic anisotropy; Magnetic force microscopy; Magnetization; Magnetometers; Perpendicular magnetic anisotropy; Thick films;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2006. INTERMAG 2006. IEEE International

Conference_Location

San Diego, CA

Print_ISBN

1-4244-1479-2

Type

conf

DOI

10.1109/INTMAG.2006.376184

Filename

4261893