DocumentCode :
2941666
Title :
Extended GO modeling of microwave backscattering from measured breaking wave crests
Author :
Zhao, Zhiqin ; West, James C.
Author_Institution :
Sch. of Electr. & Comput. Eng., Oklahoma State Univ., Stillwater, OK, USA
Volume :
7
fYear :
2003
fDate :
21-25 July 2003
Firstpage :
4198
Abstract :
In previous work, an extension to geometrical optics (EGO) that allows the application to reflecting surfaces that have radii of curvature less than the electromagnetic was used to model the microwave backscattering from numerically simulated breaking water wave crests. The same approach has now been applied to plunging wave crest profiles that were directly measured in a wave tank, and the modeled backscattering compared to reference scattering found using moment-method based numerical techniques. When considering the directly measured two-dimensional cross-sections of the breaker, EGO successfully predicts the reduction in the vertically polarized backscatter (VV) observed in the reference scattering through the interference of reflections from the breaker jet itself and the cavity under the jet. A similar reduction is not seen at horizontal polarization (HH), giving a large HH-to-VV ratio at certain times in the breaking process. A three-dimensional scattering profile was synthesized from the 2-D measurements. The EGO-modeled interference of reflections from several different points on the 3-D wave yields a deep in the VV backscattering that matches the observed in the reference scattering. Again no interference is observed in the HH scattering.
Keywords :
backscatter; electromagnetic wave scattering; geometrical optics; interference suppression; jets; numerical analysis; ocean waves; 2-D measurements; 3-D wave; breaker jet; breaking water wave crests; cavity; extended geometrical optics modeling; horizontal polarization; microwave backscattering; numerical simulation; reflecting surfaces; three-dimensional scattering profile; vertically polarized backscatter; Backscatter; Electromagnetic measurements; Electromagnetic scattering; Geometrical optics; Interference; Microwave measurements; Optical reflection; Optical scattering; Polarization; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2003. IGARSS '03. Proceedings. 2003 IEEE International
Print_ISBN :
0-7803-7929-2
Type :
conf
DOI :
10.1109/IGARSS.2003.1295462
Filename :
1295462
Link To Document :
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