Title :
Second-order nonlinear optical susceptibilities determined through gas-phase experiments
Author :
Bosshard, C. ; Gubler, U.
Author_Institution :
Inst. of Quantum Electron., Eidgenossische Tech. Hochschule, Zurich, Switzerland
Abstract :
Summary form only given. One of the great challenges in nonlinear optics is the establishment of reliable absolute values of optical nonlinearities as most measurements are made in comparison to a standard material. For third-order nonlinearities this is often fused silica, whereas /spl alpha/-quartz is typically used in second-order nonlinear optics such as e.g. frequency-doubling. Up to now there still exists a considerable uncertainty of the choice of reliable reference materials and standard values. We report on a new procedure based on third-harmonic generation (THG) which yields absolute values for the electronic second- as well as third-order susceptibility. We first calibrate the nonlinear susceptibility of fused silica against the established, quantum chemically calculated second-order hyperpolarizabilities of various gases at different pressures and determine reliable absolute values for fused silica. In a second step we use cascaded frequency-doubling and sum-frequency generation in THG of noncentrosymmetric crystals in combination with THG measurements of fused silica to determine the second-order susceptibility of these crystals.
Keywords :
nonlinear optical susceptibility; optical harmonic generation; polarisability; quartz; SiO/sub 2/; alpha-quartz; frequency-doubling; fused silica; gas-phase experiments; noncentrosymmetric crystals; reference materials; reliable absolute values; second-order hyperpolarizabilities; second-order nonlinear optical susceptibility; sum-frequency generation; third-harmonic generation; third-order susceptibility; Chemicals; Crystals; Frequency; Gases; Materials reliability; Measurement standards; Nonlinear optics; Optical harmonic generation; Optical materials; Silicon compounds;
Conference_Titel :
Quantum Electronics Conference, 2000. Conference Digest. 2000 International
Conference_Location :
Nice, France
Print_ISBN :
0-7803-6318-3
DOI :
10.1109/IQEC.2000.908147