• DocumentCode
    2942089
  • Title

    An Image Enhancement Technique in Inspecting Visual Defects of Polarizers in TFT-LCD Industry

  • Author

    Yeh, Chi-Hao ; Wu, Ful-Chiang

  • Author_Institution
    Dept. of Ind. Eng. & Manage., Nat. Taipei Univ. of Technol., Taipei
  • fYear
    2009
  • fDate
    20-22 Feb. 2009
  • Firstpage
    257
  • Lastpage
    261
  • Abstract
    This study develops an image-processing filter to enhance the visual defects such as particles, stains, and uneven intensity on polarizers in TFT-LCD industry. Each pixel in the subimage of a polarizer is initially processed to calculate its standard deviation (SD) of gray level, which is sampled by its neighbors within a window. The gray level of each pixel is re-scaled by the maximal and minimal SD values on entire subimage to determine its new gray level. Real polarizers with visual defects are tested in this study. Experimental results show that the proposed filter achieves better performance than conventional image enhancement filters do. Moreover, the proposed image enhancement scheme provides more information for potential defect detection and classification alternatives. The proposed filter is simple, straightforward, and requiring no high-resolution image. Therefore, it is practically suitable for large-polarizer manufacturers to increase inspection speed.
  • Keywords
    filtering theory; image classification; image enhancement; inspection; liquid crystal displays; production engineering computing; TFT-LCD industry; defect classification; defect detection; image enhancement technique; image-processing filter; polarizers; visual defects inspection; Colored noise; Computer industry; Costs; Filters; Image enhancement; Inspection; Machine vision; Manufacturing; Optical polarization; Thin film transistors; Image enhancement filter; Polarizers; Standard deviation; TFT-LCD;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Modeling and Simulation, 2009. ICCMS '09. International Conference on
  • Conference_Location
    Macau
  • Print_ISBN
    978-0-7695-3562-3
  • Electronic_ISBN
    978-1-4244-3561-6
  • Type

    conf

  • DOI
    10.1109/ICCMS.2009.73
  • Filename
    4797393