DocumentCode :
2942173
Title :
Towards the fluorescence resonance energy transfer (FRET) scanning near-field optical microscopy with chemical selectivity
Author :
Sekatskii, S.K. ; Shubeita, G.T. ; Chergui, M. ; Dietler, G. ; Mironov, B.N. ; Lapshin, D.A. ; Letokhov, V.S.
Author_Institution :
Inst. de Phys. de la Matiere Condensee, Lausanne Univ., Switzerland
fYear :
2000
fDate :
10-15 Sept. 2000
Abstract :
Summary form only given. The spatial resolution of scanning near-field optical microscope (SNOM) is limited by the size of an aperture for the light transmission and ranges 50-100 nm, although 20 nm resolution has been demonstrated. Further improvement of the resolution seems problematic for the "classical" SNOM configurations because the number of photons "seeping" through an aperture is rapidly decreasing with the decrease of the aperture size. A number of new approaches to improve the resolution, such as SNOM using fluorescence resonant energy transfer (FRET) between a single fluorescence center of the tip and the sample studied have been proposed.
Keywords :
fluorescence; image resolution; near-field scanning optical microscopy; resonant states; FRET scanning near-field optical microscopy; SNOM configurations; aperture; fluorescence resonance energy transfer; fluorescence resonant energy transfer; light transmission; scanning near-field optical microscopy with; single fluorescence center; spatial resolution; Energy exchange; Excitons; Fluorescence; Nonlinear optics; Optical amplifiers; Optical microscopy; Reflectivity; Resonance; Semiconductor optical amplifiers; Stimulated emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 2000. Conference Digest. 2000 International
Conference_Location :
Nice, France
Print_ISBN :
0-7803-6318-3
Type :
conf
DOI :
10.1109/IQEC.2000.908165
Filename :
908165
Link To Document :
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