DocumentCode
2942173
Title
Towards the fluorescence resonance energy transfer (FRET) scanning near-field optical microscopy with chemical selectivity
Author
Sekatskii, S.K. ; Shubeita, G.T. ; Chergui, M. ; Dietler, G. ; Mironov, B.N. ; Lapshin, D.A. ; Letokhov, V.S.
Author_Institution
Inst. de Phys. de la Matiere Condensee, Lausanne Univ., Switzerland
fYear
2000
fDate
10-15 Sept. 2000
Abstract
Summary form only given. The spatial resolution of scanning near-field optical microscope (SNOM) is limited by the size of an aperture for the light transmission and ranges 50-100 nm, although 20 nm resolution has been demonstrated. Further improvement of the resolution seems problematic for the "classical" SNOM configurations because the number of photons "seeping" through an aperture is rapidly decreasing with the decrease of the aperture size. A number of new approaches to improve the resolution, such as SNOM using fluorescence resonant energy transfer (FRET) between a single fluorescence center of the tip and the sample studied have been proposed.
Keywords
fluorescence; image resolution; near-field scanning optical microscopy; resonant states; FRET scanning near-field optical microscopy; SNOM configurations; aperture; fluorescence resonance energy transfer; fluorescence resonant energy transfer; light transmission; scanning near-field optical microscopy with; single fluorescence center; spatial resolution; Energy exchange; Excitons; Fluorescence; Nonlinear optics; Optical amplifiers; Optical microscopy; Reflectivity; Resonance; Semiconductor optical amplifiers; Stimulated emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics Conference, 2000. Conference Digest. 2000 International
Conference_Location
Nice, France
Print_ISBN
0-7803-6318-3
Type
conf
DOI
10.1109/IQEC.2000.908165
Filename
908165
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