Title :
New nonlinear features in the reflectivity and emission of microcavity polaritons
Author :
Senellart, P. ; Bloch, J. ; Marzin, J.Y.
Author_Institution :
Lab. de Microstructures et de Microelectron., CNRS, Bagneux, France
Abstract :
Summary form only given. In semiconductor microcavities, the strong coupling regime gives rise to mixed exciton-photon states named microcavity polaritons. For very low carrier densities, polaritons (like excitons) are expected to obey Bose statistics and may give rise to stimulated mechanisms. However, for large carrier densities, the fermionic nature of the exciton constituents dominates and leads to broadening of the polariton mode and reduction of the exciton oscillator strength. We report here on two beam experiments giving a closer insight into the nonlinear feature. The pump beam is non-resonant and modulated at low frequency while the probe beam is tuned across the lower polariton resonance.
Keywords :
excitons; micro-optics; micromechanical resonators; optical pumping; optical resonators; polaritons; reflectivity; Bose statistics; emission; exciton; exciton oscillator strength; fermionic nature; large carrier densities; low frequency; lower polariton resonance; microcavity polaritons; mixed exciton-photon states; modulated nonresonant pump beam; nonlinear feature; nonlinear features; polariton mode; polaritons; probe beam tuning; reflectivity; semiconductor microcavities; stimulated mechanisms; strong coupling regime; two beam experiments; very low carrier densities; Charge carrier density; Excitons; Frequency modulation; Laser excitation; Microcavities; Optical modulation; Oscillators; Probes; Reflectivity; Statistics;
Conference_Titel :
Quantum Electronics Conference, 2000. Conference Digest. 2000 International
Conference_Location :
Nice, France
Print_ISBN :
0-7803-6318-3
DOI :
10.1109/IQEC.2000.908166