DocumentCode :
2942192
Title :
Dummy fill Insertion considering the effect on high-frequency characteristics of spiral inductors
Author :
Akira Tsuchiya ; Onodera, Hidetoshi
Author_Institution :
Department of Communications and Computer Engineering, Kyoto University, Yoshida-honmachi, Sakyo-ku, 606-8501, Japan
fYear :
2008
fDate :
15-20 June 2008
Firstpage :
787
Lastpage :
790
Abstract :
This paper discusses the effect of dummy fills on spiral inductors. In fabrication processes that use copper wire, metal dummy fills are required to prevent thickness fluctuation in CMP stage. Dummy fills have been thought to affect the wire capacitance, however in high frequency, dummy fills also affect the wire resistance and the wire inductance due to the eddy current in dummy fills. This work evaluates the effect of the dummy fills by 3D field solver and proposes a method to suppress the effect of dummy fills. Experimental results show that the proposed method can decrease the effect of dummy fills on quality factor by 55%.
Keywords :
CMOS integrated circuits; Q-factor; copper; high-frequency effects; inductors; 3D field solver; CMP stage; Cu; copper wire; dummy fill insertion; high-frequency characteristics; metal dummy filler; quality factor; spiral inductors; wire capacitance; wire inductance; wire resistance; Capacitance; Copper; Eddy currents; Fabrication; Fluctuations; Frequency; Inductance; Inductors; Spirals; Wire; Spiral inductor; dummy fill; eddy current;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2008.4632950
Filename :
4632950
Link To Document :
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