DocumentCode :
2942466
Title :
Laser source independent basic parameters — Focus position, pulse overlap, track overlap — In laser micro milling using as rapid manufacturing process
Author :
Kagerer, Markus ; Irlinger, Franz ; Lueth, Tim C.
Author_Institution :
Inst. of Micro Technol. & Med. Device Technol., Tech. Univ. Munchen, München, Germany
fYear :
2012
fDate :
11-14 July 2012
Firstpage :
135
Lastpage :
140
Abstract :
Laser micro machining belongs to the most important processes in rapid prototyping / rapid manufacturing. Especially Nd:YAG lasers with a galvanometer scanner are extremely common in manufacturing Micro-Electro-Mechanical-Systems (MEMS) in a time and cost saving manner. Moreover, laser micro milling is one of the most significant processes in laser micro machining apart from laser micro cutting and micro welding. In recent years a lot of investigations were done for direct parameters of the laser source such as the laser power, the fluence, the repetition rate, the lamp current, and the pulse duration. These parameters are not applicable to other laser systems because they are depending on the used laser source. The basic parameters (focus position, pulse overlap, track overlap), which are completely independent of the used laser sources, were mostly neglected although they have a huge influence on the result of the process. Therefore, this project investigates laser micro milling square pockets in silicon with a nanosecond Nd:YAG IR laser. For each basic parameter the ablation rate, the surface roughness as well as the machining diameter are determined.
Keywords :
galvanometers; laser beam cutting; laser beam machining; laser beam welding; micromachining; micromechanical devices; milling; production engineering computing; rapid prototyping (industrial); surface roughness; MEMS manufacturing; Nd:YAG; galvanometer scanner; laser focus position; laser microcutting; laser micromachining; laser micromilling; laser microwelding; laser pulse overlap; laser source independent basic parameters; laser track overlap; microelectromechanical systems manufacturing; rapid manufacturing process; rapid prototyping; surface roughness; Laser ablation; Laser beam cutting; Laser beams; Milling; Rough surfaces; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Intelligent Mechatronics (AIM), 2012 IEEE/ASME International Conference on
Conference_Location :
Kachsiung
ISSN :
2159-6247
Print_ISBN :
978-1-4673-2575-2
Type :
conf
DOI :
10.1109/AIM.2012.6265899
Filename :
6265899
Link To Document :
بازگشت