Title :
Advanced processing techniques of high voltage impulse test signals
Author :
Angrisani, L. ; Daponte, P. ; Dias, C. ; Vale, A. Almeida Do
Author_Institution :
Dept. of Inf. & Electr. Eng., Salerno Univ., Italy
Abstract :
The paper deals with a new technique, based on the wavelet transform, for the digital processing of high voltage impulses. A brief theoretical outline about the proposed technique is first reported. Technique assessment is then carried out through numerical tests on simulated HV impulses presenting typical disturbances superposed. Finally, experimental results show technique reliability if applied to actual HV impulses
Keywords :
high-voltage techniques; signal processing; testing; wavelet transforms; actual HV impulses; digital processing; high voltage impulse test signals; high voltage impulses; reliability; simulated HV impulses; wavelet transform; Circuit noise; Circuit testing; Electromagnetic interference; Frequency; Impulse testing; Shape measurement; Signal processing; System testing; Voltage; Wavelet transforms;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-3747-6
DOI :
10.1109/IMTC.1997.612378