Title :
The effective resolution measurement in scope of sine-fit test
Author :
Hejn, Konrad ; Kramarski, Leszek ; Pacut, Andrzej
Author_Institution :
Fac. of Electron. & Inf. Technol., Warsaw Univ. of Technol., Poland
Abstract :
This paper presents a detailed analysis of the efr measurement in the scope of the IEEE Standard 1057 sine-fit test. The results obtained explain not only the reason of a poor repeatability in the efr measurement but also create some hints for improving it. The new method brought down enables compensation for the influence of the inherent bias on the efr accuracy. The idea is accomplished by substituting (to the efr definition) the correct standard deviation as depending on the amplitude V and DC bias C of a pure sine wave stimulus
Keywords :
IEEE standards; analogue-digital conversion; circuit analysis computing; curve fitting; digital simulation; simulation; ADC diagnostics; DC bias; IEEE Standard 1057; bias; compensation; effective resolution measurement; efr measurement; pure sine wave stimulus; repeatability; sine-fit test; standard deviation; Algebra; Electronic equipment testing; Histograms; Information technology; Integral equations; Measurement standards; Paper technology; Quantization; Temperature; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-3747-6
DOI :
10.1109/IMTC.1997.612380
