DocumentCode
2943134
Title
ASIC automatic layout generation using large standard cell libraries
Author
Guan, Bingzhong ; Sechen, Carl
Author_Institution
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
fYear
1996
fDate
21-24 Oct 1996
Firstpage
5
Lastpage
8
Abstract
We present an automatic layout generation methodology for ASICs utilizing large standard cell libraries. We also present a complete study of layout area and circuit performance as a result of utilizing a large library of standard cells. We built libraries of all possible static CMOS cells having a chain length of up to 7. We refer to a library of all possible cells having a chain length limit of n as sn. Although Library s7 has billions of possible cells in it, our technology mapper only selected on the order of 100 of these cells to implement each of the MCNC logic synthesis benchmark circuits. We drew the following conclusions from this study. (1) For three or more layers of metal, using very large libraries (e.g., s7) is optimal in terms of area and delay. (2) For two layers of metal, limiting the library size to s5, but at least s4, is optimal in terms of area and delay. Given that the number of distinct combinational cells in industrial libraries today never exceeds 200 (and usually considerably fewer) and given that even library s4 has 3503 distinct cells, tremendous area savings (without increase in worst case path delay) are readily available by utilizing much larger cell libraries. Specifically, given that library s3 has 87 distinct cells (current industrial libraries typically have no more than this), we surmise that area savings of about 30% can be achieved by using library s7 for three or more metal layers versus any current industrial library
Keywords
CMOS logic circuits; application specific integrated circuits; circuit layout CAD; delays; integrated circuit layout; logic CAD; ASIC automatic layout generation; MCNC logic synthesis benchmark circuits; area savings; large standard cell libraries; static CMOS cells; technology mapper; worst path delay; Application specific integrated circuits; Delay; Fabrication; Libraries; Logic design; Metals industry; Routing; Space technology; Timing; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 1996., 2nd International Conference on
Conference_Location
Shanghai
Print_ISBN
7-5439-0940-5
Type
conf
DOI
10.1109/ICASIC.1996.562737
Filename
562737
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