• DocumentCode
    294335
  • Title

    A unified analysis of stochastic adaptive control: asymptotic self-tuning

  • Author

    Nassiri-Toussi, Karim ; Ren, Wei

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • Volume
    3
  • fYear
    1995
  • fDate
    13-15 Dec 1995
  • Firstpage
    2932
  • Abstract
    The second part of a unified approach to analyzing parametric stochastic adaptive control is presented. In the first stage, the potential self-tuning issue was introduced and examined, where the authors studied self-tuning of stochastic adaptive control schemes at the possible limit points of the parameter estimates, independent of the algorithm used for estimation. In this paper, by considering a general class of estimation algorithms, the authors attempt to determine the conditions under which a certainty-equivalence (CE) based stochastic adaptive control scheme is asymptotically self-tuning. A set of general properties satisfied by some common estimation algorithms, such as stochastic gradient (SG) and weighted extended least squares (WELS), are considered. Based on these assumptions, it is shown that certain sufficient conditions for respectively, potential self-tuning or potential identifiability are also sufficient for asymptotic self-tuning or strong consistency
  • Keywords
    adaptive control; parameter estimation; self-adjusting systems; stochastic systems; asymptotic self-tuning; certainty-equivalence based stochastic adaptive control scheme; estimation algorithms; parametric stochastic adaptive control; potential identifiability; stochastic adaptive control; stochastic gradient; strong consistency; sufficient conditions; weighted extended least squares; Adaptive control; Adaptive systems; Control systems; Least squares approximation; Programmable control; Stability; Stochastic processes; Stochastic systems; Sufficient conditions; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1995., Proceedings of the 34th IEEE Conference on
  • Conference_Location
    New Orleans, LA
  • ISSN
    0191-2216
  • Print_ISBN
    0-7803-2685-7
  • Type

    conf

  • DOI
    10.1109/CDC.1995.478588
  • Filename
    478588