• DocumentCode
    2943485
  • Title

    High quality-factor and inductance of symmetric differential-pair structure active inductor using a feedback resistance design

  • Author

    Hwang, Kyu Seok ; Cho, Choon Sik ; Lee, Jae W. ; Kim, Jaeheung

  • Author_Institution
    School of Electronics, Telecommunication and Computer Engineering, Korea Aerospace University, 200-1 Hwajeon-dong, Goyang, Gyeonggi-do, Korea, 41 2-791
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    1059
  • Lastpage
    1062
  • Abstract
    This paper proposes a new symmetric differential-pair structure for the active inductor. The CMOS spiral inductor occupies a large chip size and is difficult to obtain a high Q-factor. A symmetric differential-pair active inductor circuit topology with feedback resistor is proposed, which can substantially improve its equivalent inductance and quality-factor. This feedback resistance differential-pair active inductor was implemented by using 0.18-mum TSMC RF CMOS technology, which demonstrates a maximum quality-factor of 28 with a 27-nH inductance. The proposed active inductor has one hundredth of chip size of a spiral inductor and it also shows more than ten times wide dynamic range and twice higher Q-factor compared to the conventional 1-port active inductor circuits. In addition, this configuration can be easily implemented using the series circuit.
  • Keywords
    CMOS integrated circuits; Q-factor; circuit feedback; inductance; inductors; network topology; resistors; CMOS spiral inductor; TSMC RF CMOS technology; active inductor circuit; circuit topology; feedback resistor; inductance; quality factor; size 0.18 mum; symmetric differential-pair structure active inductor; Active inductors; CMOS technology; Circuit topology; Dynamic range; Feedback; Inductance; Q factor; Radio frequency; Resistors; Spirals; Active inductor; CMOS; feedback resistor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633018
  • Filename
    4633018