Title :
Exchange bias effect on full-Heusler alloy Co2CR0.6FE0.4AI epitaxial thin films
Author :
Ishikawa, T. ; Marukame, T. ; Niwa, H. ; Matsuda, K. ; Uemura, T. ; Yamamoto, M.
Author_Institution :
Hokkaido Univ., Sapporo
Abstract :
This study investigates the exchange bias for Co2Cr0.6Fe0.4Al (CCFA) thin films epitaxially grown on MgO buffer layers. The CCFA/Ru/Co90Fe10 (CoFe) trilayers exchange biased with an IrMn layer through the CoFe/IrMn interface is investigated. Antiferromagnetic coupling was well established for all the CCFA/Ru/CoFe trilayers with tCCTA of between 2.5 and 4.0 nm and thus confirming that the CCFA/Ru/CoFe trilayers were synthetic ferrimagnets.
Keywords :
aluminium alloys; antiferromagnetic materials; buffer layers; chromium alloys; cobalt alloys; exchange interactions (electron); ferrimagnetic materials; ferromagnetic materials; iron alloys; magnetic epitaxial layers; magnetic multilayers; magnetisation; ruthenium; Co2Cr0.6Fe0.4Al-Co90Fe10-Ru; antiferromagnetic coupling; buffer layers; exchange bias; full-Heusler alloy epitaxial thin films; synthetic ferrimagnets; trilayers; Antiferromagnetic materials; Buffer layers; Electrodes; Fabrication; Magnetic films; Magnetic tunneling; Sputtering; Substrates; Transistors; Tunneling magnetoresistance;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.376301