Exchange bias effect on full-Heusler alloy Co2CR0.6FE0.4AI epitaxial thin films

Author

Ishikawa, T. ; Marukame, T. ; Niwa, H. ; Matsuda, K. ; Uemura, T. ; Yamamoto, M.

Author_Institution

Hokkaido Univ., Sapporo

fYear

2006

fDate

8-12 May 2006

Firstpage

577

Lastpage

577

Abstract

This study investigates the exchange bias for Co₂Cr_0.6Fe_0.4Al (CCFA) thin films epitaxially grown on MgO buffer layers. The CCFA/Ru/Co₉₀Fe₁₀ (CoFe) trilayers exchange biased with an IrMn layer through the CoFe/IrMn interface is investigated. Antiferromagnetic coupling was well established for all the CCFA/Ru/CoFe trilayers with t_CCTA of between 2.5 and 4.0 nm and thus confirming that the CCFA/Ru/CoFe trilayers were synthetic ferrimagnets.

Keywords

aluminium alloys; antiferromagnetic materials; buffer layers; chromium alloys; cobalt alloys; exchange interactions (electron); ferrimagnetic materials; ferromagnetic materials; iron alloys; magnetic epitaxial layers; magnetic multilayers; magnetisation; ruthenium; Co₂Cr_0.6Fe_0.4Al-Co₉₀Fe₁₀-Ru; antiferromagnetic coupling; buffer layers; exchange bias; full-Heusler alloy epitaxial thin films; synthetic ferrimagnets; trilayers; Antiferromagnetic materials; Buffer layers; Electrodes; Fabrication; Magnetic films; Magnetic tunneling; Sputtering; Substrates; Transistors; Tunneling magnetoresistance;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2006. INTERMAG 2006. IEEE International

Conference_Location

San Diego, CA

Print_ISBN

1-4244-1479-2

Type

conf

DOI

10.1109/INTMAG.2006.376301

Filename

4262010