Title :
Generalized mergeability in space compressor design in built-in self-test of VLSI circuits
Author :
Das, Sunil R. ; Barakat, Tony ; Nayak, Amiya R. ; Assai, M.H.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
In this paper, we establish a generalized mergeability criteria for merging an arbitrary number of output sequences under conditions of stochastic independence of line errors. This result extends previously known mergeability criteria for merging pairs of output sequences. We also provide preliminary simulation results on combinational benchmark circuits
Keywords :
VLSI; built-in self test; combinational circuits; data compression; design for testability; logic design; logic testing; performance evaluation; stochastic systems; VLSI circuits; built-in self-test; combinational benchmark circuits; generalized mergeability criteria; line errors; output sequences; simulation results; space compressor design; stochastic independence; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Computer science; Merging; Read only memory; Stochastic processes; Very large scale integration;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-3747-6
DOI :
10.1109/IMTC.1997.612439
