Title : 
An accurate and stable fourth order finite difference time domain method
         
        
            Author : 
Wilson, Joshua ; Wang, Cheng ; Yang, Songnan ; Fathy, Aly E. ; Kang, Yoon W.
         
        
            Author_Institution : 
University of Tennessee. Knoxville, USA
         
        
        
        
        
        
            Abstract : 
A long-stencil fourth order finite difference method over a Yee-grid is developed to solve Maxwellpsilas equations. The different variables are located at staggered mesh points, and a symmetric image formula is introduced near the boundary. The introduction of these symmetric ghost grid points assures the stability of the boundary extrapolation, and in turn a complete set of purely imaginary eigenvalues are given for the fourth-order discrete curl operators for both electric and magnetic fields. Subsequently, the four-stage Jameson method integrator constrained by a pre-determined time step is utilized to produce a stable full fourth order accuracy in both time and space. The accuracy of the developed numerical scheme has been validated by comparing its results to the closed form solutions for a rectangular cavity.
         
        
            Keywords : 
Maxwell equations; computational electromagnetics; eigenvalues and eigenfunctions; finite difference time-domain analysis; rectangular waveguides; Jameson method integrator; Maxwell equation; Yee grid; boundary extrapolation; electric fields; fourth order finite difference time domain method; fourth-order discrete curl operators; magnetic fields; purely imaginary eigenvalues; rectangular cavity; staggered mesh point; symmetric ghost grid points; Closed-form solution; Eigenvalues and eigenfunctions; Extrapolation; Finite difference methods; Grid computing; Magnetic fields; Maxwell equations; Neutrons; Stability; Time domain analysis; Jameson¿s method; Runge-Kutta; Yee-grid; finite difference time domain;
         
        
        
        
            Conference_Titel : 
Microwave Symposium Digest, 2008 IEEE MTT-S International
         
        
            Conference_Location : 
Atlanta, GA
         
        
        
            Print_ISBN : 
978-1-4244-1780-3
         
        
            Electronic_ISBN : 
0149-645X
         
        
        
            DOI : 
10.1109/MWSYM.2008.4633032