DocumentCode
2944094
Title
Dynamic, weight-based sampling algorithm
Author
Purdy, Matthew
Author_Institution
Adv. Micro Devices, Austin
fYear
2007
fDate
15-17 Oct. 2007
Firstpage
1
Lastpage
4
Abstract
In this paper, a novel sampling algorithm that allows for multiple, independent rules to be efficiently merged into a single sampling decision will be presented. A brief discussion of past sampling technologies that motivated the development of the new system will also be included. Finally, the ability of the application to deal with various factory dynamics will be discussed.
Keywords
measurement; sampling methods; independent rules; single sampling decision; weight-based sampling algorithm; Automatic control; Counting circuits; Etching; Heuristic algorithms; Manufacturing; Metrology; Monitoring; Production facilities; Resource management; Sampling methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1523-553X
Print_ISBN
978-1-4244-1142-9
Electronic_ISBN
1523-553X
Type
conf
DOI
10.1109/ISSM.2007.4446804
Filename
4446804
Link To Document