• DocumentCode
    2944108
  • Title

    A novel measurement based method enabling rapid extraction of a RF Waveform Look-Up table based behavioral model

  • Author

    Woodington, S. ; Williams, T. ; Qi, H. ; Williams, D. ; Pattison, L. ; Patterson, A. ; Lees, J. ; Benedikt, J. ; Tasker, P.J.

  • Author_Institution
    School of Engineering, Cardiff University, UK, CF24 3TF
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    1453
  • Lastpage
    1456
  • Abstract
    A solution allowing for the rapid, cost effective and accurate extraction of nonlinear Direct Waveform Look-Up table (DWLU) based behavioral models is presented in this paper. The behavioral model extracted is a reformulation of the PHD model, now defined about a non 50-Ohm reference impedance, enabling it to accurately predict load-pull contours. The technique exploits a simple active and passive load-pull architecture enabling a numerical integration solution for model coefficient extraction that necessitates only varying the phase of the input stimulus during measurement. This solution dramatically speeds up the behavioral model coefficient extraction process, enabling dasiareal timepsila access to critical device behavior. It ensures that only a minimum, optimized set of load-pull measurements are performed. The technique is demonstrated on a Mimix Broadband Gas 8times2times30 um 0.5 W HBT.
  • Keywords
    heterojunction bipolar transistors; microwave power amplifiers; Mimix Broadband Gas HBT; RF waveform look-up table; nonlinear direct waveform look-up table; power 0.5 W; Data mining; Design automation; Distortion measurement; Impedance; Power amplifiers; Power measurement; Predictive models; Radio frequency; Radiofrequency amplifiers; Table lookup; Poly Harmonic Distortion Model; microwave measurements; non-linear device modeling; power amplifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633053
  • Filename
    4633053