• DocumentCode
    2944164
  • Title

    An eight-phase voltage controlled oscillator with reflection-type modulators in 0.18-¿m CMOS technology

  • Author

    Lin, Chi-Hsien ; Chang, Hong-Yeh

  • Author_Institution
    Department of Electrical Engineering, National Central University, Jhongli, 32001 Taiwan, R.O.C.
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    1465
  • Lastpage
    1468
  • Abstract
    This paper describes a fully integrated eightphase voltage controlled oscillator (VCO) monolithic microwave integrated circuit (MMIC) with reflection-type modulators in 0.18-mum CMOS Technology. The characterization of the amplitude and phase errors is successfully demonstrated using the proposed innovative method. The eight-phase VCO achieves a low phase noise of -117.1 dBc/Hz at 1-MHz offset frequency. For the characterization of the amplitude and phase errors, this circuit features a sideband suppression of better than -26 dBc and a LO suppression of better than -18 dBc. From the sideband suppression contours, the measured amplitude and phase errors of the eight-phase VCO are within 0.85 dB and 5deg, respectively. To the best of the authorspsila knowledge, this work is the first attempt to demonstrate the characterization of the amplitude and phase errors for the eight-phase VCO.
  • Keywords
    CMOS integrated circuits; MMIC; voltage-controlled oscillators; CMOS technology; MMIC; VCO; amplitude errors; eight-phase voltage controlled oscillator; frequency 1 MHz; monolithic microwave integrated circuit; phase errors; reflection-type modulators; sideband suppression; size 0.18 mum; CMOS integrated circuits; CMOS technology; Frequency; Integrated circuit technology; MMICs; Microwave integrated circuits; Microwave technology; Monolithic integrated circuits; Phase noise; Voltage-controlled oscillators; Multi-phase; VCO; phase noise; reflection-type modulator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633056
  • Filename
    4633056