Title :
Morphological changes in polyethylene under electrical stress
Author :
Noon, T. ; Das-Gupta, D.K.
Author_Institution :
Sch. of Electron. Eng. & Comput. Syst., Univ. of Wales, Bangor, UK
Abstract :
The results of infrared spectroscopy showed that orientational changes occur in electrically stressed (>4×107 V m -1) low density polyethylene (LDPE). Furthermore, an investigation of highly crystalline polyethylene with X-ray diffraction spectrometry show that the sizes of para-crystalline region varied by approximately 12 Å and the crystalline regions were seen to change in size by approximately 3 Å for the applied field in the range 0.5-1.0×107 V m-1. Above data suggest a presence of the phenomenon of defect motion in electrically stressed polyethylene
Keywords :
X-ray diffraction; electric field effects; infrared spectra; noncrystalline defects; polyethylene insulation; polymer structure; LDPE; X-ray diffraction; defect motion; electrical stress; infrared spectroscopy; low density polyethylene; morphology; para-crystalline region; Amorphous materials; Bonding; Crystallization; Electrodes; Electromagnetic wave absorption; Infrared spectra; Polyethylene; Stress; Systems engineering and theory; X-ray diffraction;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
Conference_Location :
Minneapolis, MN
Print_ISBN :
0-7803-3851-0
DOI :
10.1109/CEIDP.1997.641110
