DocumentCode :
2944521
Title :
On-demand inspection recipe to detect defects of interest using Mahalanobis distance
Author :
Ono, Makoto ; Konishi, Junko ; Funakoshi, Tomohiro ; Sugahara, Hitoshi
Author_Institution :
Hitachi Ltd., Yokohama
fYear :
2007
fDate :
15-17 Oct. 2007
Firstpage :
1
Lastpage :
5
Abstract :
An on-demand inspection recipe-setup method to detect defects of interest (DOI) was proposed. The method applies Maharanobis distance to recognize DOI-like defects without its own recipe. Moreover, actual application was evaluated and the method effectiveness was confirmed from viewpoints of on-demand processing time and DOI detection. The proposed method enables inspection tool managers to rapidly select an appropriate recipe which detects the most DOI from several initial recipes. The future research work will focus on several examinations for threshold decision based on reviewing all detected defects experimentally.
Keywords :
inspection; Mahalanobis distance; defects of interest; detect defects; inspection tool managers; on-demand inspection recipe; on-demand processing time; Acceleration; Circuits; Gas detectors; Inspection; Laboratories; Manufacturing processes; Production engineering; Scanning electron microscopy; Semiconductor device manufacture; Semiconductor devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1523-553X
Print_ISBN :
978-1-4244-1142-9
Electronic_ISBN :
1523-553X
Type :
conf
DOI :
10.1109/ISSM.2007.4446828
Filename :
4446828
Link To Document :
بازگشت