DocumentCode :
2944772
Title :
Vector near-field measurement system using an electro-optic microcavity and electrical downconversion
Author :
Lee, Dong-Joon ; Kang, Jeong-Jin ; Chia-Chu Chen ; Whitaker, John F.
Author_Institution :
Center for Ultrafast Optical Science and Department of Electrical Engineering and Computer Science, University of Michigan, 2200 Bonisteel Boulevard, Ann Arbor, 48109-2099, USA
fYear :
2008
fDate :
15-20 June 2008
Firstpage :
1589
Lastpage :
1592
Abstract :
An electro-optic (EO) field-mapping system that features a continuous-wave laser-diode optical source, an entirely fiber-coupled beam path, a resonance-assisted EO-microcavity probe, and an RF-downconversion mixing circuit is shown to be effective for extracting near-field vector RF information. The system is the first of its kind to allow amplitude and phase analysis of signals interrogated with a continuous optical beam and no polarization components in the EO-modulation section. A complete tangential-electric-field characterization in the near field of an RFID antenna - a small planar loop intended for applications in mobile-reader instruments - is presented, with a >35 dB signal-to-noise ratio attained.
Keywords :
electro-optical devices; measurement systems; mixers (circuits); semiconductor lasers; EO-modulation section; RF-downconversion mixing circuit; RFID antenna; amplitude analysis; complete tangential-electric-field characterization; continuous optical beam; continuous wave laser diode optical source; electrical downconversion; electrooptic field-mapping system; electrooptic microcavity; fiber-coupled beam path; mobile reader instruments; phase analysis; planar loop; polarization components; resonance-assisted EO-microcavity probe; vector near-field measurement system; Electric variables measurement; Electrooptic effects; Fiber lasers; Laser beams; Lasers and electrooptics; Microcavities; Optical beams; Optical fiber polarization; Optical mixing; Resonance; Dipole antennas; Fabry-Perot resonators; distributed feedback lasers; electrooptic measurements; electrooptic modulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2008.4633087
Filename :
4633087
Link To Document :
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