• DocumentCode
    2944791
  • Title

    High current and transconductance AlGaN/GaN MODFETs at elevated temperatures

  • Author

    Aktas, O. ; Fan, Z.F. ; Lu, C. ; Botchkarev, A. ; Mohammad, S. ; Roth, M. ; Morkoc, H.

  • Author_Institution
    Illinois Univ., Urbana, IL, USA
  • fYear
    1997
  • fDate
    23-25 June 1997
  • Firstpage
    140
  • Lastpage
    141
  • Abstract
    The high electron peak and saturation velocity and a large breakdown field attributes of GaN combined with its good thermal conductivity and stability make it a suitable material for electrical devices intended for high power applications. The wide band gap of GaN leads to low intrinsic carrier concentration enabling a more precise control of free carrier concentration over a wide range of temperatures. In this paper we present AIGaN/GaN double heterostructure channel MODFET exhibiting record dc performance at room and elevated temperatures.
  • Keywords
    III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; high-temperature techniques; wide band gap semiconductors; AIGaN/GaN double heterostructure channel MODFET; AlGaN-GaN; DC performance; current; elevated temperature; transconductance; Aluminum gallium nitride; Conducting materials; Electric breakdown; Electrons; Gallium nitride; HEMTs; MODFETs; Thermal conductivity; Thermal stability; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 1997. 5th
  • Conference_Location
    Fort Collins, CO, USA
  • Print_ISBN
    0-7803-3911-8
  • Type

    conf

  • DOI
    10.1109/DRC.1997.612504
  • Filename
    612504