DocumentCode :
2944791
Title :
High current and transconductance AlGaN/GaN MODFETs at elevated temperatures
Author :
Aktas, O. ; Fan, Z.F. ; Lu, C. ; Botchkarev, A. ; Mohammad, S. ; Roth, M. ; Morkoc, H.
Author_Institution :
Illinois Univ., Urbana, IL, USA
fYear :
1997
fDate :
23-25 June 1997
Firstpage :
140
Lastpage :
141
Abstract :
The high electron peak and saturation velocity and a large breakdown field attributes of GaN combined with its good thermal conductivity and stability make it a suitable material for electrical devices intended for high power applications. The wide band gap of GaN leads to low intrinsic carrier concentration enabling a more precise control of free carrier concentration over a wide range of temperatures. In this paper we present AIGaN/GaN double heterostructure channel MODFET exhibiting record dc performance at room and elevated temperatures.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; high-temperature techniques; wide band gap semiconductors; AIGaN/GaN double heterostructure channel MODFET; AlGaN-GaN; DC performance; current; elevated temperature; transconductance; Aluminum gallium nitride; Conducting materials; Electric breakdown; Electrons; Gallium nitride; HEMTs; MODFETs; Thermal conductivity; Thermal stability; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference Digest, 1997. 5th
Conference_Location :
Fort Collins, CO, USA
Print_ISBN :
0-7803-3911-8
Type :
conf
DOI :
10.1109/DRC.1997.612504
Filename :
612504
Link To Document :
بازگشت