DocumentCode
2944814
Title
Application of robust design for the tuning of resistance-temperature characteristics in diodes
Author
Kuramochi, N. ; Mochiduki, K. ; Tsuchitani, M.
Author_Institution
TOSHIBA, Kawasaki
fYear
2007
fDate
15-17 Oct. 2007
Firstpage
1
Lastpage
4
Abstract
It is of a great importance to fabricate products in multiple factories or lines with the identical characteristics. Fine tuning of the process parameters is required in factory to factory or line to line transplantation to ensure the identical performance of the product since the equivalence of the process parameters between different plants is not always maintained. This paper examines the novel approach using the standard SN ratio analysis to adjust process parameters for the new production line to obtain the same output as the referential one.
Keywords
semiconductor device noise; semiconductor diodes; diode; resistance-temperature characteristic; signal noise ratio analysis; tuning method; Microelectronics; Noise level; Production facilities; Robustness; Semiconductor device noise; Semiconductor diodes; Signal analysis; Signal to noise ratio; Temperature; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1523-553X
Print_ISBN
978-1-4244-1142-9
Electronic_ISBN
1523-553X
Type
conf
DOI
10.1109/ISSM.2007.4446843
Filename
4446843
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