DocumentCode :
2944837
Title :
Gated diamond field emitter array with ultra low operating voltage and high emission current
Author :
Wisitsora-at, A. ; Kang, W.P. ; Davidson, J.L. ; Howell, M. ; Li, Q. ; Xu, J.F. ; Kerns, D.V.
Author_Institution :
Dept. of Electr. & Comput. Eng., Vanderbilt Univ., Nashville, TN, USA
fYear :
1997
fDate :
23-25 June 1997
Firstpage :
150
Lastpage :
151
Abstract :
Gated Diamond Field Emitter Array with ultra low operating voltage and high emission current has been reported for the first time. Two types of built-in gated diamond field emitter have been successfully fabricated: a volcano gated structure by self-align technique and a cap gated structure by electrostatic bonding. Diamond was deposited by PECVD on a silicon inverted pyramidal mold. The mold was then etched away. To construct the gated volcano emitter, a 2 /spl mu/m-thick SiO and a 1 /spl mu/m-thick Al were deposited on the diamond tips. Self-align technique was then performed to obtain the gated volcano structure with SiO as a gate dielectric and Al as a gate. To construct the cap gated emitter, an anode comprised of heavily doped silicon was electrostatically bonded to the substrate with a SiO/sub 2/ dielectric spacer between, forming an emitter-anode spacing of 2 /spl mu/m.
Keywords :
diamond; electron field emission; vacuum microelectronics; Al gate; C; PECVD; SiO gate dielectric; SiO/sub 2/ dielectric spacer; cap gated structure; electrostatic bonding; emission current; gated diamond field emitter array; self-align technique; silicon inverted pyramidal mold; ultralow operating voltage; volcano gated structure; Anodes; Artificial intelligence; Bonding; Dielectric substrates; Electrostatics; Etching; Field emitter arrays; Low voltage; Silicon; Volcanoes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference Digest, 1997. 5th
Conference_Location :
Fort Collins, CO, USA
Print_ISBN :
0-7803-3911-8
Type :
conf
DOI :
10.1109/DRC.1997.612507
Filename :
612507
Link To Document :
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