DocumentCode :
2944970
Title :
Systematic classification from the functional view in the check items for equipment quality assurance upon installation
Author :
Ikeda, Masatoshi
Author_Institution :
Semicond. Leading Edge Technol. Inc., Tokyo
fYear :
2007
fDate :
15-17 Oct. 2007
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, the methods and performed results are described regarding the technique for performing the equipment QA upon installation in high efficiency and high accuracy. By creating related tables and linking equipment QA item check lists and QA contents sheets, it is possible to examine the QA check items comprehensively. Then it is possible to clarify the purpose of check items and to prioritize execution of QA contents. The "QA item checklists for purchasing equipment" were created using this method for each type of wafer process equipment.
Keywords :
production equipment; quality assurance; semiconductor device manufacture; QA content sheet; equipment QA item check list; equipment quality assurance; wafer process equipment; Concrete; Joining processes; Lead compounds; Production facilities; Production planning; Production systems; Productivity; Quality assurance; Stability; Technology planning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1523-553X
Print_ISBN :
978-1-4244-1142-9
Electronic_ISBN :
1523-553X
Type :
conf
DOI :
10.1109/ISSM.2007.4446851
Filename :
4446851
Link To Document :
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