• DocumentCode
    2944970
  • Title

    Systematic classification from the functional view in the check items for equipment quality assurance upon installation

  • Author

    Ikeda, Masatoshi

  • Author_Institution
    Semicond. Leading Edge Technol. Inc., Tokyo
  • fYear
    2007
  • fDate
    15-17 Oct. 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, the methods and performed results are described regarding the technique for performing the equipment QA upon installation in high efficiency and high accuracy. By creating related tables and linking equipment QA item check lists and QA contents sheets, it is possible to examine the QA check items comprehensively. Then it is possible to clarify the purpose of check items and to prioritize execution of QA contents. The "QA item checklists for purchasing equipment" were created using this method for each type of wafer process equipment.
  • Keywords
    production equipment; quality assurance; semiconductor device manufacture; QA content sheet; equipment QA item check list; equipment quality assurance; wafer process equipment; Concrete; Joining processes; Lead compounds; Production facilities; Production planning; Production systems; Productivity; Quality assurance; Stability; Technology planning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1523-553X
  • Print_ISBN
    978-1-4244-1142-9
  • Electronic_ISBN
    1523-553X
  • Type

    conf

  • DOI
    10.1109/ISSM.2007.4446851
  • Filename
    4446851