DocumentCode
2944970
Title
Systematic classification from the functional view in the check items for equipment quality assurance upon installation
Author
Ikeda, Masatoshi
Author_Institution
Semicond. Leading Edge Technol. Inc., Tokyo
fYear
2007
fDate
15-17 Oct. 2007
Firstpage
1
Lastpage
4
Abstract
In this paper, the methods and performed results are described regarding the technique for performing the equipment QA upon installation in high efficiency and high accuracy. By creating related tables and linking equipment QA item check lists and QA contents sheets, it is possible to examine the QA check items comprehensively. Then it is possible to clarify the purpose of check items and to prioritize execution of QA contents. The "QA item checklists for purchasing equipment" were created using this method for each type of wafer process equipment.
Keywords
production equipment; quality assurance; semiconductor device manufacture; QA content sheet; equipment QA item check list; equipment quality assurance; wafer process equipment; Concrete; Joining processes; Lead compounds; Production facilities; Production planning; Production systems; Productivity; Quality assurance; Stability; Technology planning;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing, 2007. ISSM 2007. International Symposium on
Conference_Location
Santa Clara, CA
ISSN
1523-553X
Print_ISBN
978-1-4244-1142-9
Electronic_ISBN
1523-553X
Type
conf
DOI
10.1109/ISSM.2007.4446851
Filename
4446851
Link To Document