Title :
High-speed resonant-cavity SAM avalanche photodiodes
Author :
Nie, H. ; Anselm, K.A. ; Hu, C. ; Lenox, C. ; Streetman, B.G. ; Campbell, J.C.
Author_Institution :
Microelectron. Res. Center, Texas Univ., Austin, TX, USA
Abstract :
Separate absorption and multiplication (SAM) APDs have been widely deployed in long-wavelength, high-bit-rate optical transmission systems. At high bit-rates (>10 GBit/s), however, the bandwidth and the gain-bandwidth-product of the SAM APDs has become a limitation. Recently, we have developed a resonant-cavity SAM APD structure that circumvents both of these performance limitations. Since the quantum efficiency is decoupled from the transit time in the resonant-cavity structure, bandwidths >20 GHz have been achieved in the low-gain regime. At high gains, the response of an APD is determined by the gain-bandwidth-product. The use of very thin multiplication layers in the resonant-cavity structures has led to low noise (/spl beta///spl alpha/=k<0.25) and gain-bandwidths as high as 180 GHz. The external quantum efficiency of these resonant-cavity SAM APDs is about 80 %, resulting in a record bandwidth-efficiency product as well. The breakdown voltage (V/sub b/) is <15 V and the dark current is <10 nA at 90% V/sub b/.
Keywords :
III-V semiconductors; aluminium compounds; avalanche photodiodes; gallium arsenide; optical receivers; semiconductor device noise; 10 Gbit/s; 10 nA; 15 V; 26 GHz; 80 percent; AlGaAs-GaAs; bandwidth-efficiency product; breakdown voltage; dark current; gain-bandwidth-product; high-speed resonant-cavity SAM avalanche photodiodes; long-wavelength high-bit-rate optical transmission systems; low noise; low-gain regime; quantum efficiency; resonant-cavity SAM APD structure; separate absorption/multiplication APDs; transit time; very thin multiplication layers; Absorption; Avalanche photodiodes; Bandwidth; Breakdown voltage; Dark current; Distributed Bragg reflectors; Gallium arsenide; Mirrors; Oxidation; Resonance;
Conference_Titel :
Device Research Conference Digest, 1997. 5th
Conference_Location :
Fort Collins, CO, USA
Print_ISBN :
0-7803-3911-8
DOI :
10.1109/DRC.1997.612514