Title :
MEMS liquid metal through-wafer microstrip to microstrip transition
Author :
Liu, Xiaoguang ; Katehi, Linda P B ; Peroulis, Dimitrios
Author_Institution :
School of Electrical and Computer Engineering, Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana, USA
Abstract :
A novel approach for creating an RF MEMS switch in the form of a microstrip-to-microstrip liquid-metal transition is presented. A slug of non-toxic liquid metal that controllably fills a through-wafer via is the key component of the switch. The large contact area between this slug and the solid microstrip lines renders this design an excellent candidate for high-power switching and particularly for hot-switching applications. With the slug inside the via the switch presents a measured insertion loss of 0.24 and 1.1 dB up to 5 and 10 GHz respectively. When the slug is removed from the via the switch isolation is measured to be more than 20 dB up to 7 GHz. The fabrication technology and critical trade-offs between RF and microfluidic performances are discussed in the paper. The slug movement is controlled by an external micropump. The recent advances in microfluidics have resulted in a large variety of practical micropumps that may be monolithically integrated with such switching designs.
Keywords :
liquid metals; microfluidics; microstrip transitions; microswitches; RF MEMS switch; frequency 10 GHz; frequency 5 GHz; frequency 7 GHz; high-power switching; insertion loss; loss 0.24 dB; loss 1.1 dB; microfluidic performances; micropump; microstrip lines; microstrip-to-microstrip transition; nontoxic liquid metal slug; Contacts; Fabrication; Insertion loss; Loss measurement; Microfluidics; Micromechanical devices; Micropumps; Microstrip components; Radiofrequency microelectromechanical systems; Switches; RF MEMS; liquid metal; microfluidics; microtrip transition; power amplifiers;
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2008.4633098