DocumentCode :
2945520
Title :
A novel reconfigurable impedance matching network using DGS and MEMS switches for millimeter-wave applications
Author :
Fouladi, S. ; Akhavan, Ali ; Mansour, R.R.
Author_Institution :
University of Waterloo, Ontario, Canada, N2L 3G1
fYear :
2008
fDate :
15-20 June 2008
Firstpage :
145
Lastpage :
148
Abstract :
This paper presents a novel approach in order to construct low-loss reconfigurable impedance matching networks and tuners using MEMS series-contact switches and periodic defected-ground-structures (DGSs) implemented on coplanar waveguide (CPW) transmission lines. The application of DGSs results in an improved insertion loss and power handling capability compared to the conventional RF MEMS impedance tuning networks. The proposed structure consists of 12 DGSs and RF MEMS series-contact switches producing 4096 (212) impedance states. The tunable matching network was fabricated on an alumina substrate and is only 1.3 times 3.6 mm in size. The measured results demonstrate wide coverage of the Smith chart with a maximum VSWR of 12:1 at 60 GHz. The measured loss of the network when used to match a 10 Omega load to 50 Omega from 22 GHz up to 40 GHz is only 0.5 dB.
Keywords :
coplanar waveguide components; impedance matching; microswitches; millimetre wave devices; periodic structures; DGS switch; MEMS series-contact switche; MEMS switch; coplanar waveguide transmission lines; frequency 22 GHz to 40 GHz; frequency 60 GHz; millimeterwave application; periodic defected-ground-structures; reconfigurable impedance matching network; size 1.3 mm to 3.6 mm; tunable matching network; Coplanar transmission lines; Coplanar waveguides; Impedance matching; Insertion loss; Micromechanical devices; Microswitches; Power transmission lines; Radiofrequency microelectromechanical systems; Switches; Tuners; MEMS series-contact switch; RF MEMS; defected-ground-structure (DGS); impedance tuner; reconfigurable matching network;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2008.4633124
Filename :
4633124
Link To Document :
بازگشت