DocumentCode
2945522
Title
Individual nanowire handling for NEMS fabrication
Author
Bartenwerfer, Malte ; Fatikow, Sergej ; Zeng, Hongjiang ; Li, Tie ; Wang, Yuelin
Author_Institution
Dept. of Comput. Sci., Univ. of Oldenburg, Oldenburg, Germany
fYear
2012
fDate
11-14 July 2012
Firstpage
562
Lastpage
567
Abstract
This paper presents the development of a novel technique for well directed handling of nanowires made of different materials with diameters down to 100nm or less and length up to several ten μms. The presented transfer technique uses an adhesive bond handling approach and is able to bridge any distance between the nanowire´s source and target. The operational range is only limited by the robotic setup, which is mounted inside a high-resolution scanning electron microscope. Additionally, focused ion beam and gas injection systems are used. This transfer approach is a seminal technique towards an assembly of nanowire based devices.
Keywords
adhesive bonding; focused ion beam technology; industrial robots; materials handling; nanoelectromechanical devices; nanofabrication; nanowires; scanning electron microscopy; NEMS fabrication; adhesive bond handling approach; focused ion beam system; gas injection systems; high-resolution scanning electron microscopes; nanowire based devices; robotic setup; End effectors; Scanning electron microscopy; Substrates; Tungsten; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Intelligent Mechatronics (AIM), 2012 IEEE/ASME International Conference on
Conference_Location
Kachsiung
ISSN
2159-6247
Print_ISBN
978-1-4673-2575-2
Type
conf
DOI
10.1109/AIM.2012.6266052
Filename
6266052
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