• DocumentCode
    2945522
  • Title

    Individual nanowire handling for NEMS fabrication

  • Author

    Bartenwerfer, Malte ; Fatikow, Sergej ; Zeng, Hongjiang ; Li, Tie ; Wang, Yuelin

  • Author_Institution
    Dept. of Comput. Sci., Univ. of Oldenburg, Oldenburg, Germany
  • fYear
    2012
  • fDate
    11-14 July 2012
  • Firstpage
    562
  • Lastpage
    567
  • Abstract
    This paper presents the development of a novel technique for well directed handling of nanowires made of different materials with diameters down to 100nm or less and length up to several ten μms. The presented transfer technique uses an adhesive bond handling approach and is able to bridge any distance between the nanowire´s source and target. The operational range is only limited by the robotic setup, which is mounted inside a high-resolution scanning electron microscope. Additionally, focused ion beam and gas injection systems are used. This transfer approach is a seminal technique towards an assembly of nanowire based devices.
  • Keywords
    adhesive bonding; focused ion beam technology; industrial robots; materials handling; nanoelectromechanical devices; nanofabrication; nanowires; scanning electron microscopy; NEMS fabrication; adhesive bond handling approach; focused ion beam system; gas injection systems; high-resolution scanning electron microscopes; nanowire based devices; robotic setup; End effectors; Scanning electron microscopy; Substrates; Tungsten; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Intelligent Mechatronics (AIM), 2012 IEEE/ASME International Conference on
  • Conference_Location
    Kachsiung
  • ISSN
    2159-6247
  • Print_ISBN
    978-1-4673-2575-2
  • Type

    conf

  • DOI
    10.1109/AIM.2012.6266052
  • Filename
    6266052