• DocumentCode
    2945628
  • Title

    Accelerated time-domain modeling of microstrip based microwave circuit geometries on periodic substrates

  • Author

    Li, Dongying ; Sarris, Costas D.

  • Author_Institution
    The Edward S. Rogers Sr. Department of Electrical and Computer Engineering, University of Toronto, ON, M5S 3G4, Canada
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    165
  • Lastpage
    168
  • Abstract
    Advances in the design of electromagnetic bandgap and meta-material structures have opened new possibilities for substrate engineering to optimize the performance of microstrip or coplanar waveguide based integrated microwave circuits. Periodic substrates alone can be fully characterized through their dispersion analysis. On the other hand, modeling the interaction between metallic guides and such substrates usually involves lengthy simulations, because the resulting geometry is non-periodic. We propose a finite-difference time-domain based solution to this problem, which leads to significant acceleration of the relevant modeling process over broad bandwidths, without compromising accuracy.
  • Keywords
    coplanar waveguides; energy gap; finite difference time-domain analysis; metamaterials; microstrip circuits; microwave integrated circuits; periodic structures; accelerated time-domain modeling; coplanar waveguide; dispersion analysis; electromagnetic band-gap; finite-difference time-domain based solution; integrated microwave circuits; metallic guides; metamaterial; microstrip based circuit; microwave circuit; periodic substrates; substrate engineering; Acceleration; Design engineering; Design optimization; Electromagnetic waveguides; Geometry; Microstrip; Microwave circuits; Periodic structures; Solid modeling; Time domain analysis; FDTD; microwave circuits; periodic boundary conditions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633129
  • Filename
    4633129