Title :
A fast-marching time-domain layered finite-element reduction-recovery method for high-frequency VLSI design
Author :
Gan, Houle ; Jiao, Dan
Author_Institution :
School of Electrical and Computer Engineering, Purdue University, West Lafayette, IN 47907, USA
Abstract :
In this paper, a fast-marching time-domain layered finite-element reduction-recovery (LAFE-RR) method is proposed for high-frequency modeling and simulation of large-scale integrated circuits. This method increases the time step of the LAFE-RR method by three orders of magnitude. In addition, it preserves the computational efficiency of the LAFE-RR method, i.e., the matrix reduction is achieved analytically from a three-dimensional layered system to a single-layer one regardless of the original problem size, and the sparsity of the reduced single-layer system matrix is the same as that of the original system matrix. The method applies to any arbitrarily-shaped multilayer structure. Numerical and experimental results are given to demonstrate its validity.
Keywords :
VLSI; finite element analysis; matrix algebra; time-domain analysis; computational efficiency; fast-marching time-domain; finite-element reduction-recovery; high-frequency VLSI design; large-scale integrated circuits; single-layer system matrix; Boundary conditions; Conductors; Finite element methods; Frequency; Integrated circuit modeling; Nonhomogeneous media; RLC circuits; Time domain analysis; Transmission line matrix methods; Very large scale integration; High frequency; electromagnetics; finite element methods; on-chip circuits; time domain analysis;
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2008.4633130