• DocumentCode
    2945724
  • Title

    Millimeter-wave CMOS digital controlled artificial dielectric differential mode transmission lines for reconfigurable ICs

  • Author

    LaRocca, Tim ; Tam, Sai-Wang ; Huang, Daquan ; Gu, Qun ; Socher, Eran ; Hant, William ; Chang, Frank

  • Author_Institution
    Department of Electrical Engineering, University of California, Los Angeles, 90095, USA
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    181
  • Lastpage
    184
  • Abstract
    Digital control of the effective dielectric constant of a differential mode transmission line is shown up to 60 GHz in standard CMOS technology. The effective dielectric constant is shown to increase from 5 to over 50 for the fixed artificial dielectric case. The digital controlled artificial dielectric transmission line (DiCAD) uses MOS switches to dynamically control the phase. DiCAD achieves 50% of the physically available tuning range with effective dielectric constants varying between 7 and 28. Measured results favorably agree with full-wave electromagnetic simulations.
  • Keywords
    CMOS digital integrated circuits; MIS devices; coplanar transmission lines; digital control; microwave switches; millimetre wave phase shifters; permittivity; slow wave structures; CMOS technology; MOS switches; artificial dielectric differential mode transmission lines; coplanar transmission lines; effective dielectric constant; frequency 60 GHz; full-wave electromagnetic simulations; millimeter-wave CMOS digital control; permittivity; phase shifters; reconfigurable ICs; slow wave structures; CMOS technology; Dielectric constant; Digital control; Distributed parameter circuits; Millimeter wave communication; Millimeter wave technology; Power transmission lines; Strips; Switches; Transmission lines; Coplanar Transmission Lines; Digital Control; Permittivity; Phase Shifters; Slow Wave Structures;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633133
  • Filename
    4633133