DocumentCode :
2945876
Title :
Active silicon-based shockwave formation
Author :
Buckwalter, James F.
Author_Institution :
University of California-San Diego, La Jolla, 92093, USA
fYear :
2008
fDate :
15-20 June 2008
Firstpage :
201
Lastpage :
204
Abstract :
An active shockwave transmission line topology is presented that demonstrates edge sharpening to under 10ps using an impedance variation technique. The circuit is demonstrate to sharpen the transition time for periodic signals and consumes under 20 mW while reducing the fall time by 20ps. The circuit is fabricated in a 120 nm CMOS technology and occupies an area of 1.5 mm by 0.4 mm.
Keywords :
CMOS integrated circuits; microwave circuits; network topology; transmission lines; CMOS technology; active shockwave transmission line topology; active silicon-based shockwave formation; edge sharpening; electrical pulse sharpening; impedance variation technique; Active inductors; Admittance; Coils; Distributed parameter circuits; Impedance; MOS devices; Performance loss; Power transmission lines; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location :
Atlanta, GA
ISSN :
0149-645X
Print_ISBN :
978-1-4244-1780-3
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2008.4633138
Filename :
4633138
Link To Document :
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