Title :
Design and optimization of a dual-antenna structure for passive RFID tags using design of experiments technique
Author :
Chen, Yen-Sheng ; Chen, Shih-Yuan ; Li, Hsueh-Jyh
Author_Institution :
Grad. Inst. of Commun. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
This paper presents a systematic approach for the design and optimization of a dual-antenna structure for RFID tags. In order to successfully design a dual-antenna structure, the input impedance of the receiving antenna should be conjugate matched to that of the tag chip, and the input impedance of the backscattering antenna must be purely real. To achieve the design goals for both antennas while keeping a low mutual coupling, the design of experiments (DOE) technique is adopted, and the regression models in terms of geometric parameters can be attained via the analysis of variance (ANOVA). With these models, the response variables can be predicted. A series of solutions toward these models can be obtained by formulating the problem into a constrained optimization problem; these solutions are further ranked according to their Derringer´s desirability function. The solution with the higher overall desirability are whereby considered as the optimal design. with this systematic approach, the design procedure is greatly simplified.
Keywords :
UHF antennas; backscatter; design of experiments; optimisation; radiofrequency identification; receiving antennas; regression analysis; ANOVA; DOE technique; analysis of variance; backscattering antenna; design of experiments technique; desirability function; dual-antenna structure design; dual-antenna structure optimization; input impedance; passive RFID tags; radiofrequency identification; receiving antenna; regression model; Analysis of variance; Analytical models; Backscatter; Impedance; Optimization; Receiving antennas; US Department of Energy; Derringer´s desirability functions; design of experiments (DOE); optimization method; radio-frequency identification (RFID);
Conference_Titel :
Antennas and Propagation (APSURSI), 2011 IEEE International Symposium on
Conference_Location :
Spokane, WA
Print_ISBN :
978-1-4244-9562-7
DOI :
10.1109/APS.2011.5997135