• DocumentCode
    2946127
  • Title

    A robust approach for comparison and validation of large signal measurement systems

  • Author

    Williams, Tudor ; Mojón, Orentino ; Woodington, Simon ; Lees, Jonathan ; Barciela, Mónica F. ; Benedikt, J. ; Tasker, P.J.

  • Author_Institution
    School of Engineering , Cardiff University, CF24 3TF UK
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    257
  • Lastpage
    260
  • Abstract
    As time-domain RF measurement tools gain recognition and acceptance, it becomes increasingly important to identify and compare the different systems being used, and to quantify any differences observed. In this paper, a robust validation approach is identified and used to compare a number of completely different large-signal measurement systems. Unlike a previous dasiaround-robinpsila exercise, the solution does not require an accurately modeled non-linear reference component to account for system impedance variations when comparing results, which clearly introduces additional complexity and the possibility of errors. Instead, active loadpull, coupled with a common passive source network is used to present a consistent impedance environment to a device under test. After employing this method, large signal data from two completely different measurement architectures employing different instruments and calibration procedures showed excellent agreement. This approach has proved useful in the validation and comparison of a number of large signal measurement and could be used to increase confidence in such systems.
  • Keywords
    calibration; radiofrequency measurement; signal processing; calibration; large signal measurement systems; passive source network; power amplifier design; time-domain RF measurement; Calibration; Frequency measurement; Gain measurement; Impedance measurement; Instruments; Power measurement; Radiofrequency identification; Robustness; Sampling methods; Time measurement; Device Characterization; Large-signal Measurements; Power Amplifier Design; Waveform measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633152
  • Filename
    4633152