DocumentCode
2946127
Title
A robust approach for comparison and validation of large signal measurement systems
Author
Williams, Tudor ; Mojón, Orentino ; Woodington, Simon ; Lees, Jonathan ; Barciela, Mónica F. ; Benedikt, J. ; Tasker, P.J.
Author_Institution
School of Engineering , Cardiff University, CF24 3TF UK
fYear
2008
fDate
15-20 June 2008
Firstpage
257
Lastpage
260
Abstract
As time-domain RF measurement tools gain recognition and acceptance, it becomes increasingly important to identify and compare the different systems being used, and to quantify any differences observed. In this paper, a robust validation approach is identified and used to compare a number of completely different large-signal measurement systems. Unlike a previous dasiaround-robinpsila exercise, the solution does not require an accurately modeled non-linear reference component to account for system impedance variations when comparing results, which clearly introduces additional complexity and the possibility of errors. Instead, active loadpull, coupled with a common passive source network is used to present a consistent impedance environment to a device under test. After employing this method, large signal data from two completely different measurement architectures employing different instruments and calibration procedures showed excellent agreement. This approach has proved useful in the validation and comparison of a number of large signal measurement and could be used to increase confidence in such systems.
Keywords
calibration; radiofrequency measurement; signal processing; calibration; large signal measurement systems; passive source network; power amplifier design; time-domain RF measurement; Calibration; Frequency measurement; Gain measurement; Impedance measurement; Instruments; Power measurement; Radiofrequency identification; Robustness; Sampling methods; Time measurement; Device Characterization; Large-signal Measurements; Power Amplifier Design; Waveform measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2008 IEEE MTT-S International
Conference_Location
Atlanta, GA
ISSN
0149-645X
Print_ISBN
978-1-4244-1780-3
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2008.4633152
Filename
4633152
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